Article 5116

Title of the article

A SEARCH OF A LAW OF ELECTRONIC MODULE RELIABILITY CHANGE BY THE METHOD OF SYMBOL REGRESSION 

Authors

Diveev Askhat Ibragimovich, doctor of technical sciences, head of department of safety and nonlinear analysis, Dorodniсyn Computer Center of the Russian Academy of Sciences (119333, 40 Vavilov street, Moscow, Russia), aidiveev@mail.ru
Shmal'ko Elizaveta Yur'evna, candidate of technical sciences, scientific worker, department of safety and nonlinear analysis, Dorodniсyn Computer Center of the Russian Academy of Sciences (119333, 40 Vavilov street, Moscow, Russia), asiedora@mail.ru
Zhadnov Valeriy Vladimirovich, candidate of technical scienсes, associate professor, sub-department of radio electronic and telecommunications, Moscow Institute of Electronic and Mathematic of National Research University «High School of Economics» (101000, 20 Myasnitskaya street, Moscow, Russia), vzhadnov@hse.ru

Index UDK

621.3.088, 51-74

Abstract

A reliability index of various electronics is determined by the experimental data of tests for different values of parameters of the equipment. The received data are collected in bulky tables and references. This paper presents modern numerical approach, allowing to compile the experimental data on changes of reliability index not in the form of tables but as a function of the operating parameters of the devices. The methodology is based on the method of network operator for the design of the optimal structure of function and selection of its parameters. The network operator method belongs to a class of methods of symbolic regression and provides an evolutionary search for the best compositions of mathematical expressions on the space of elementary structures. The method allows you to automatically receive the required description of the functional dependencies. The effectiveness of the method is demonstrated by the example of searching the law, which describes the change in the failure rate depending on three parameters that characterize its constructive and technological performance and operating conditions.

Key words

failure rate, reliability index, electronics, symbolic regression, evolutionary search.

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Дата создания: 18.05.2016 11:09
Дата обновления: 19.05.2016 10:15